Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
78 (2001), S. 1939-1941
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We developed an improved ultrasonic atomic force microscopy (UAFM) for mapping resonance frequency and Q factor of a cantilever where the tip is in linear contact with the sample. Since the vibration amplitude at resonance is linearly proportional to the Q factor, the resonance frequency and Q factor are measured in the resonance tracking mode by scanning the sample in the constant force mode. This method enables much faster mapping of the resonance frequency and Q factor than the previous one using a network analyzer. In this letter, we describe the principle and instrumentation of the UAFM and show images of carbon-fiber-reinforced plastic composites. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1357540
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