Digitale Medien
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
74 (1999), S. 2528-2530
ISSN:
1077-3118
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
We have fabricated Si/Ta/Fe55Ni45/FeMn/Fe55Ni45/Al2O3/Fe55Ni45/Ta spin-dependent tunneling junctions, in which the tunneling barrier is formed by plasma oxidation. The as-deposited Fe55Ni45/FeMn bilayer has a surface exchange energy of 0.13 erg/cm2. A maximum tunneling magnetoresistive ratio of 16.5% is obtained in the junctions. We also developed an in situ resistance measurement technique to monitor tunneling barrier thickness during plasma oxidation. The plasma oxidation data are fitted to an oxide growth model based on cation hopping current and sputtering. © 1999 American Institute of Physics.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.123896
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