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A noninvasive bunch length monitor for femtosecond electron bunches (1997)

Wang, D. X. ; Kraft, G. A. ; Price, E.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 70 (1997), S. 529-531

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: A bunch length monitor for ultrashort (90 fs to 1 ps) electron bunches using a coherent synchrotron radiation detection techniques has been developed in a collaboration between the Thomas Jefferson National accelerator Facility (Jefferson Lab) and the University of Virginia. The noninvasive, high-resolution, high-sensitivity, low-noise monitor employs a state-of-the-art "bandpass" GaAs Schottky whisker diode operated at room temperature. This letter presents the monitor's performance. © 1997 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.118423

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