Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
70 (1997), S. 3149-3151
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
An investigation of superconductor/semiconductor/superconductor Josephson junctions with separations between the Nb superconducting electrodes down to 20 nm is presented. To achieve such short distances, a preparation technique employing an anodic Nb oxide film as a spacer has been developed. The Nb electrodes are coupled through the quasi two-dimensional electron gas in the native inversion layer at the surface of p-type InAs. High characteristic voltages up to 1.35 mV at T=2 K are observed. A sensitive dependence of the magnitude of the characteristic voltage on interface quality is demonstrated. Good agreement is found between the experimental temperature dependence of the critical current and a theoretical model valid for short weak links. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.119116
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