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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 554-556 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The formation of YBa2Cu3O7−y(YBCO)/BaTiO3(BTO)//SrTiO3(STO) (100) and BTO/ YBCO//STO(100) bilayer structures is demonstrated for the construction of a superconductor ferroelectric field transistor. The resulting films of the bilayers have highly c-axis oriented structure. Epitaxial YBCO films formed on the BTO//STO(100) have a zero resistance temperature of 88.9 K. The surface morphology of the epitaxial BTO films on the YBCO//STO is very smooth with a mean surface roughness of 32 A(ring). Moreover, the Au/BTO/YBCO structures have been fabricated, and the dielectric constant and remanent polarization of BTO layer are obtained to be 180 and 3.5 μC/cm2 at 77 K, respectively. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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