Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
63 (1993), S. 556-558
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Microstructural studies of TlBa2Ca2Cu3Ox(Tl-1223) thick films that exhibit high critical current densities (Jc) for nonepitaxial polycrystalline materials show that these films possess a "brick-wall'' structure that may be partly responsible for high current densities. The magnetic field dependence of Jc is similar to that reported for Bi-Sr-Ca-Cu-O materials that exhibit this structure. Structural analyses indicate a high degree of c-axis alignment but little in-plane texture, suggesting that high-angle [001] tilt boundaries are prevalent. Scanning and transmission electron microscopy reveal that the microstructure consists of overlapping layers reminiscent of the brick-wall structure. These results suggest that high critical current densities may be achieved by percolative transport through this structure.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.110003
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