Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
89 (2001), S. 3619-3621
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We report the pattering of sp3- and sp2-bonded carbon by using conducting atomic-force microscopy (AFM) working in the noncontact mode. A ta-C film with ∼80% sp3 bonds was scanned by the conducting AFM with a biased tip. A current image that clearly shows gray/white and black features was obtained while scanning in the noncontact mode. These features were proposed to be the result of the different electron emission abilities of the sp3- and sp2-bonded carbon in the film. The result not only enables us to image the distribution of the sp3 and sp2 bonds of a-C, but also extends the AFM to provide the electron emission information of a-C on a nanometer scale. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1354654
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