Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
87 (2000), S. 6331-6333
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have investigated single electron tunneling in Co–Al–O and Cu–Al–O granular films using scanning tunneling microscopy (STM). Topographic images show well-defined granular structures where nanometer-sized metal granules are embedded in insulating matrix. The Coulomb staircases in the current–voltage (I–V) curves are clearly observed even at room temperature in both films. For the Co–Al–O film, furthermore, negative differential conductance appears in the Coulomb staircase. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.372696
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