Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
86 (1999), S. 7071-7078
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
This report focuses on the ionization mechanism of dynamic space charge formation during ac thin-film electroluminescent device operation. Laser excitation under operating condition is used to identify the ionization mechanism. It is concluded, that Ce3+ ionization and ionization of other deep levels are forming the dynamic space charge. The charge emission process is impact excitation in combination with tunnel emission. The Ce3+ excited state is more than 0.23 eV below the conduction band and the ground state of other deep levels is more than 3.6 eV below the conduction band. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.371794
Library |
Location |
Call Number |
Volume/Issue/Year |
Availability |