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Microwave field distribution in superconducting thin film devices (1996)

Quenter, D. ; Doderer, T. ; Huebener, R. P.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 80 (1996), S. 3566-3573

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: We measured the spatial distribution of microwave fields and dissipative surface currents in various passive and active superconducting thin-film devices during their operation at a temperature of about 4 K. We used low-temperature scanning electron microscopy which offers a spatial resolution of about 1 μm and we present sample response models for interpreting the imaging results. Such investigations may have important consequences for the improvement of the design and preparation of superconducting thin-film microwave devices. © 1996 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.363230

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