ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The microstructural differences of YBa2Cu3O7−δ (YBCO) films prepared by in situ magnetron sputtering on (100)-SrTiO3 and (100)-LaAlO3 substrates have been investigated. A detailed analysis of the film orientation by means of Raman spectroscopy has been developed, showing that a certain amount of a-axis oriented grains always nucleate on the LaAlO3 surface, at the optimal deposition conditions for c-axis epitaxy. High-resolution electron microscopy has been used to show the epitactic nature of the YBCO films and has provided evidence for the orientational differences. A clear correlation between the degree of misorientation and the surface microstructure has been shown by atomic force microscopy and scanning tunneling microscopy, the bulk structure of these samples being reflected by their surface morphology. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.360609
