Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
74 (1993), S. 6642-6644
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
An expression for Auger lifetime as a function of temperature has been derived for a heavily doped Hg1−xCdxTe in the presence of a nonparabolicity of band structure, band gap narrowing, and carrier degeneracy. It is utilized to study the variation of Auger lifetime with temperature through numerical analysis.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.355106
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