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Growth kinetics of solid-state-reacted Fe-Zr multilayer films (1991)

Paesano, A. ; Teixeira, S. R. ; Amaral, L.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 70 (1991), S. 4870-4876

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: Multilayers of Fe0.33Zr0.67, prepared by electron beam evaporation, have been characterized by conversion electron Mössbauer spectroscopy, Rutherford backscattering spectroscopy, and x-ray diffraction. Two phases, one amorphous and another crystalline (FeZr3), occur by solid-state reaction. For temperatures of 350 and 500 °C and annealing times ranging from 10 min to 72 h the growth rates of both phases had been obtained. From these results we suggest a model to describe the phase growth kinetics of the amorphous-crystalline Fe0.33Zr0.67 multilayer thin film.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.349029

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