ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A novel measurement technique and an analytical model for the determination of externally induced noise in floppy disk heads have been developed. Floppy disk heads are generally susceptible to magnetic fields from, among other things, machinery and CRTs. When an alternating magnetic field is applied to a floppy disk head, a magnetic flux will penetrate into the head, inducing a noise voltage in its coil. Since the floppy disk head has a complex geometry, the magnetic-flux distribution in the head is complicated. The distribution has been studied by a three-dimensional finite-element analysis and effective methods for reducing the noise voltage have been found. New heads have been fabricated according to the analysis results and a noise voltage reduced by 50% has been obtained. The measured noise voltages agree well with the calculated values.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.347997
