Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
65 (1989), S. 2827-2832
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We report pseudodielectric functions of SixGe1−x alloys at room temperature, measured ellipsometrically on polycrystalline samples and single-crystal epitaxial layers, in the 1.7–5.6 eV range. Accurate values of the E1 threshold energies are obtained from numerically differentiated spectra. The measured dependence of E1 on x provides an efficient way to determine the alloy composition x. The spectral and compositional dependence of the optical constants forms a data base for optical studies of Si/SiGe layered structures.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.342720
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