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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 1625-1631 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The electron-attachment rate constants of HCl diluted in Ar and N2 were measured as a function of the reduced electric field E/N. These data were converted to the electron-attachment cross section of HCl using the electron-energy distribution functions of pure Ar and N2. The dependence of the electron-attachment rate constant and the mean electron energy on the fraction of HCl in each buffer gas was investigated. A comparison of the current result with both available experimental data and theoretical calculations is made.
    Type of Medium: Electronic Resource
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