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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 5751-5755 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ultrahigh vacuum in situ transmission electron microscopy has been used to investigate homoepitaxial growth processes and a 2×2 surface reconstruction of InSb(∼(111)) by molecular-beam epitaxy. When the incident fluxes (1:1) of Sb4 and In1 are impinged onto the substrate, the respective molecules form homoepitaxially grown InSb films, leaving an excess molecule Sb* which does not contribute to the formation of the InSb films. As a result, there exists a critical temperature (Th) for the condensation of Sb* molecules. Below Th, the surface concentration of Sb* (nSbB|) becomes higher than a critical concentration for the condensation (ncSb*), so that two phases (InSb+Sb) grow in a polycrystalline state. However, above Th as nSbB| becomes lower than ncSb*, InSb films grow with the 2×2 reconstructed surfaces. This critical temperature is defined as a homoepitaxial temperature. Quantitative interpretations of Th are discussed.
    Type of Medium: Electronic Resource
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