Digitale Medien
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
60 (1986), S. 3438-3443
ISSN:
1089-7550
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
We present x-ray absorption measurements on silicon clusters and silicon plasmas produced by pulsed laser irradiation of bulk silicon. The results are compared with earlier time-resolved x-ray absorption measurements on amorphous silicon foils under pulsed laser irradiation. Clusters are formed at an irradiance as low as 3.0 J/cm2. At an irradiance of 14 J/cm2 ionized species up to Si4+ are formed. We find a removed Si layer thickness of 80 A(ring) at an irradiance of ≈6 J/cm2, at 15 ns pulse duration.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.337593
Bibliothek |
Standort |
Signatur |
Band/Heft/Jahr |
Verfügbarkeit |