ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A new nonoptical shear force detection for scanning near-field optical microscopes is proposed in this article. Its main characteristic is a simple and fast tip replacement. The probe is mechanically in contact with a piezoelectric plate of a homemade tuning fork, ensuring a direct coupling and avoiding the fiber tip gluing. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1287632