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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 696-697 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Direct fast H− beam chopping in a surface-plasma-type negative hydrogen ion source has been studied at KEK. The H− beam is chopped at several MHz by modulating the converter bias voltage of the ion source. However, in this case, a slow rise time of the chopped H− beam is one of the most serious problems for synchrotron injection. In order to make the rise time faster, a negative voltage was applied to the anode electrode. In the new scheme, mesh inserts were installed inside the ion extraction hole of the anode. Applying a retarding voltage on the meshes, the fast beam chopping was tested and the results are reported and discussed in the article. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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