ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We report on the design of a diffractometer, which offers improved capabilities for x-ray experiments in ultrahigh vacuum. Its main features are (i) the possibility to follow the evolution of diffraction spots in situ during adsorption or film deposition; (ii) the measurement of reflections at high exit angles, i.e., large perpendicular momentum transfer. This goal is achieved by placing a movable x-ray detector inside the vacuum chamber. (iii) Other surface analysis equipment, e.g., a low-energy electron diffraction or an electron energy analyzer can be moved in front of the sample and operated simultaneously with x-ray diffraction. (iv) A load lock system—currently in preparation—will allow the quick exchange of samples without breaking system vacuum. In addition, a new design of the chi circle used for sample alignment provides a compact, space-saving design of the diffractometer. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1149899
