ISSN:
1089-7623
Quelle:
AIP Digital Archive
Thema:
Physik
,
Elektrotechnik, Elektronik, Nachrichtentechnik
Notizen:
We have designed, constructed, and tested a three-point bending system for in situ studies of slip in ionic crystals with an atomic force microscope (AFM). The work is aimed at developing a novel instrumental attachment for an in situ study of plastic deformation. The bending system is installed inside the optical head of the AFM on top of the piezoelectric scanner. Since the bending should not obstruct scanning, a piezocrystal is used for bending as well as an external stepper motor, which is connected with a screw in the bending system via a flexible shaft. The bending system performs over a relatively wide, continuous deflection range. The operation of the three-point bending system is illustrated by experiments on an ionic material in which the effect of macroscopic bending is demonstrated at an atomic scale. © 1997 American Institute of Physics.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.1148419
