ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
An attenuated total reflection (ATR) instrument for the observation of angle- and frequency-scanned ATR spectra has been constructed. Light characterized by various wave vectors and dispersed into a spectrum has been detected by a charge coupled device camera after reflection from a rotating mirror and a diffraction grating. Two elliptic mirrors and a prism-sample unit have been set between the rotating mirror and the diffraction grating for the purpose of controlling the light path. The images obtained have been analyzed by a digital image processing system so that angle-scanned ATR signals are obtained for various wavelengths (500–800 nm). The time required to acquire one image has been 0.7 s in the present system. The dependence of the dielectric constant of a Ag film on wavelength is given here as an example measured by our system. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147426
