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Electrometer preamplifier for scanning tunneling microscopy (1996)

Chen, Y. P. ; Cox, A. J. ; Hagmann, M. J. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 67 (1996), S. 2652-2653

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: An optimized current preamplifier, consisting of a shunt resistor followed by a high speed field-effect transistor input instrumentation amplifier, appears suitable for use in scanning tunneling microscopy. The preamplifier has a transimpedance of 100 MΩ, a measured 3 dB bandwidth of 200 kHz, low phase distortion, and excellent noise performance. © 1996 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1147185

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