Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
65 (1994), S. 1419-1422
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A description of methods is given which are used in computer programs for the simulation of extraction systems for ion sources. Specific equations which are important for ion beam extraction will be given. The need of specialized programs will be pointed out with the help of examples.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144980
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