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Determination of the critical current density in HTSC thin-film multilayers (1992)

Behner, H. ; Rauch, W. ; Gornik, E.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 63 (1992), S. 4373-4376

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: In this paper the limitations and perspectives of a simple remanent field technique for the determination of the critical current density (jc) in high-temperature superconductor (HTSC) thin films and in HTSC thin-film multilayers at 77 K were examined. As the comparison with resistive jc measurements on microbridges shows, jc values down to 104 A/cm2 can easily be measured with high accuracy. The method is nondestructive, fast, and inexpensive. It is especially suitable for jc measurements of double-sided coated substrates, where the determination of the individual jc values of both thin-film layers is possible.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1143737

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