ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. The design is based on spring-loaded clips and permits rapid sample exchange. Difficulties with certain conventional methods of temperature measurement are avoided.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142960