Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
62 (1991), S. 1372-1373
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A method of measuring under pressure the thermoelectric power along the thickness of thin specimens is described. This method is useful in measuring thermoelectric power in a direction perpendicular to the cleavage plane of a crystal.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142504
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