Library

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 3308-3308 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Progress in the magnetic fusion programs has driven and been driven by the development of sophisticated diagnostic systems. The application of state of the art technologies has resulted in major strides in detailed measurements of plasma characteristics. We present the details of design studies carried out to develop specialized instrumentation. For application to optical spectroscopy, a compact multichannel spectroscopic monitor is described. This instrument is designed for simultaneous observation of plasma emissions from a variety of spatial locations. The heart of the system is an optical filter mosaic and MCP/CCD array. Applications include impurity emission monitoring, particle inventory, and working gas fraction measurements in minority heating experiments. The second instrument includes a detector design for application to high time resolution measurements of electron cyclotron emissions. The system is based on arrays of slot-antennae/detectors manufactured on single semiconductor wafers. This millimeter-wave monolithic integrated circuit (MMIC) device can be tailored to detect radiation in the 50–300 GHz range typical of tokamak plasmas. Advantages include uniformity of detector response, spectral resolution without gratings, and high spatial resolution. Details of both designs will be discussed with emphasis on ranges of application in present and next generation machines.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...