Electronic Resource
s.l. ; Stafa-Zurich, Switzerland
Solid state phenomena
Vol. 144 (Sept. 2008), p. 112-117
ISSN:
1662-9779
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Physics
Notes:
The paper presents an application of non-destructive estimate of approximatedistributions of residual stresses as the function of surface layer depth. The application uses aninnovative technique of wavelet analysis of Barkhausen noise, which is able to estimate layout ofsurface layer properties as the function of measurement depth in the range greater than that offeredby other methods of non-destructive testing. The estimate of stress distribution as the function ofdepth is compared with the result obtained from X-ray stress test using electrolytic etching. Thecomparison presents very similar curves of stress distribution, so the wavelet analysis ofBarkhausen noise can be considered as a reliable method of non-destructive testing of anengineering object
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/24/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.144.112.pdf
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