ISSN:
1662-9779
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Physics
Notes:
The structural analysis of thin cerium dioxide films doped with Cu, produced by laserablation for applications in catalytic and gas sensors, was the general aim of the study. The thin films deposited on a (100) silicon substrate were nanocrystalline structure with a well-developed texture. The morphology, as well as the preferred films orientation, is changed with the volume fraction of Cu. The observed changes affect the catalytic properties of the materials obtained which was confirmed by the catalytic tests undertaken with CH4
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.99-100.235.pdf