Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
58 (1991), S. 2744-2745
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have fabricated and characterized the first GexSi1−x optical directional couplers. These structures were fabricated from GexSi1−x grown by rapid thermal processing chemical vapor deposition. The average attenuation of single, straight waveguide sections was 3.3 dB/cm at a wavelength of 1.52 μm. For the directional couplers, the coupling coefficient was 3.9 cm−1 for a waveguide separation of 1.5 μm.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.104773
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