ISSN:
1662-8985
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Porous silicon (PS) layers were formed by anodization on polished substrates of (1 0 0)Si at different current densities for a fixed anodization time of 30 mins. using different screenprinted/evaporated back contacts (Ag, Al) respectively. The PS films has been characterized byhigh resolution X-ray diffraction (HRXRD), photoluminescence (PL), Scanning ElectronMicroscopy (SEM) and Fourier Transform Infrared (FTIR) techniques respectively. Porosity andthickness of PS layers were estimated by gravimetric analysis. The properties of PS formed usingscreen-printed Ag & Al as the back contacts (SP-(Ag/Al)) was found to be superior as compared tothe corresponding films with evaporated back contacts (EV-(Ag/Al)). The PS formed with screenprintedAg & Al-back contacts shows better crystalline perfection, higher stability, higher PLefficiency and negligible PL decay compared to that formed with evaporated Ag & Al- as the backcontact for the same current density and time of anodization
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/40/transtech_doi~10.4028%252Fwww.scientific.net%252FAMR.31.249.pdf
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