ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
In order to give experimental insights on the atomic structure of the Si atomic wiresdeveloping on the β-SiC(100) surface, we use synchrotron radiation-based x-ray diffraction atgrazing incidence to study a network of such atomic lines in a 5x2 surface array. Our results lead toan accurate surface and sub-surface structure determination evidencing a structure in agreementwith a two adlayer symmetric dimer reconstruction. This atomic structure is significantly differentfrom the 3x2 surface structure, giving new insights on the Si atomic lines stability
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/17/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.556-557.533.pdf
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