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  • 1
    Electronic Resource
    Electronic Resource
    High Resolution Electron Microscopy (1987)
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Physical Chemistry 38 (1987), S. 57-88 
    Details
    ISSN: 0066-426X
    Source: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1146/annurev.pc.38.100187.000421
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  • 2
    Electronic Resource
    Electronic Resource
    The structure of Pt particles on γ-Al2O3 support (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 300-305 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Samples of the catalyst Pt/γ-Al2O3 have been examined by high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy (STEM) and microdiffraction techniques. An epitaxic relationship of metallic Pt crystals on the γ-Al2O3 has been established. In both calcined and reduced samples, the crystalline oxide α-PtO2 was found along with metallic Pt. The oxide has a hexagonal lattice with unit-cell dimensions about 6% smaller than those previously reported. Microdiffraction from areas less than 20 Å in diameter, combined with HRTEM, STEM and secondary electron microscopy (SEM), has proved to be a very powerful technique for the study of the structures of particles less than 50 Å in size.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086631
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  • 3
    Electronic Resource
    Electronic Resource
    The present and future of high-resolution electron microscopy (1987)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 43 (1987), S. 737-751 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: High-resolution electron microscopy, with the current resolution limits of better than 2 Å, has been proven to be a valuable technique for the study of radiation-resistant crystals, allowing the determination of the structures of perfect crystal regions, crystal defects and crystal surfaces with atomic resolution. As the resolution is improved, however, the image contrast is increasingly determined by dynamical diffraction effects and it is increasingly sensitive to the instrumental parameters and to the geometry and alignment of the specimen. For both the conventional transmission electron microscope and the scanning transmission electron microscope, further developments should lead to better or more versatile performance, up to the limits set by the fundamental problems of radiation damage. Major advances may be expected from developments of the associated techniques of microanalysis and microdiffraction. Applications of particular interest will include studies of surfaces and interfaces, small particles and radiation-induced chemical reactions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S010876738709857X
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  • 4
    Electronic Resource
    Electronic Resource
    Electron-microscope imaging of short-range order in disordered alloys (1987)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 43 (1987), S. 337-346 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Dynamical diffraction effects of diffuse scattering due to point defects in crystals and the associated imaging are studied in relation to imaging of the short-range order in disordered alloys through theoretical formulations and computer image simulations. Simulations of gold crystals including one point defect without strain show that the image contrast is localized in atomic size and relatively insensitive to the defect depth when the total thickness is fixed. The contrast from a small number of defects in an atomic column can be simply related to the number of defects by a nonlinear expression. An approximate imaging theory for short-range order in disordered binary alloys is discussed. The present study shows that the important parameters for observations of defective crystals are total thickness and microscope defocus, but not the defect depth. With controlled values of these parameters and sample conditions, the images of disordered binary alloys can be interpreted semi-quantitatively.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767387099318
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  • 5
    Electronic Resource
    Electronic Resource
    High-resolution electron microscopy of disordered Au–15at.%Mn alloys (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 43 (1987), S. 41-48 
    Details
    ISSN: 1600-5740
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S010876818709832X
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  • 6
    Electronic Resource
    Electronic Resource
    Effects of the coherence of illumination on electron microdiffraction pattern intensities (1987)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 7 (1987), S. 177-183 
    Details
    ISSN: 0741-0581
    Keywords: Coherence width ; Field emission guns ; Out-of-phase domain boundaries ; Spot splitting microdiffraction ; Electrical instabilities ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Microdiffraction is capable of revealing the local structure within an area of the specimen consisting of only a few, or a few tens of, unit cells. However, the extent to which the diffraction pattern intensities can show the local structure depends strongly on the coherence of the illumination. If the coherence width of the illumination is smaller than the diameter of the electron probe at the specimen level, the details within the diffraction spots, which indicate deviations of the local structure from the periodicity of the crystal, will be lost. The differences in the amount of spot splitting observed in microdiffraction patterns from out-of-phase domain boundaries, observed with two instruments, are attributed to differences in the effective source sizes.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060070305
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  • 7
    Electronic Resource
    Electronic Resource
    Geometric analysis of surface resonance conditions in reflection high energy electron diffraction (1987)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 6 (1987), S. 43-53 
    Details
    ISSN: 0741-0581
    Keywords: Ewald sphere ; Refraction ; Specular reflection ; Double diffraction ; Diffraction geometry ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A three-dimensional analysis in reciprocal space is used to analyse reflection high energy electron diffraction (RHEED) patterns. Particular emphasis is placed on investigating the surface resonance phenomenon, the resonance conditions, and the diffraction mechanisms. The surface resonance regions defined by the resonance beam threshold conditions are related to the limits for the specular reflection spot in the diffraction pattern. The introduction of an Ewald sphere of varying radius is shown to be useful in understanding the surface phenomenon. Simulations based on the geometric theory, taking account of the surface refraction effect, describe very well the RHEED pattern geometry from the (111) surface of a platinum single crystal.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060060107
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