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  • 1985-1989  (5)
  • 1989  (5)
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  • 1985-1989  (5)
Year
  • 1
    Electronic Resource
    Electronic Resource
    Current-controlled negative differential resistance in four-terminal heterostructure devices (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2452-2454 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate new effects of the current-controlled (S-shaped) negative differential resistance (NDR) in different circuit configurations of four-terminal modulation-doped AlGaAs/GaAs heterostructure devices, with the magnitude of the voltage drop varied by external electrodes. We observe two S-shaped instabilities having different physical origins. One effect arises due to an avalanche in the top AlGaAs layer underneath the reverse-biased gate region. Another phenomenon relies on the creation, during the avalanche, of nonequilibrium hot electrons at the conducting channel (quantum well). This dramatically enhances electron flow over the heterostructure barriers and gives rise to a strongly pronounced current-controlled NDR with a peak-to-valley ratio of ∼10.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101069
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    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Junction field-effect transistor single quantum well optical waveguide modulator employing the two-dimensional Moss–Burstein effect (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2177-2179 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A modulation-doped junction field-effect transistor incorporating an optical waveguide under the gate modulates light by the carrier band-filling effect (two-dimensional Moss–Burstein effect) in a single quantum well, achieving a 5:1 extinction ratio in a 250-μm-long waveguide for 4 V reverse gate-source bias Vgs swing and 0 V drain-source bias Vds. Similar performance is obtained over a 16 nm spectral range. A novel band-edge transparency effect is observed for Vds〉0 allowing an extinction ratio of 10:1, corresponding to a change in absorption of 92 cm−1 to be obtained through band-gap dilation by hot electrons at biases of Vds =8 V. Below-band-gap refractive index modulation of 1.6×10−3 is obtained for a Vgs swing of 2.4 V. The novel junction field-effect transistor optical modulator also functions as a photovoltaic or photoconductive optical detector, a transistor, and a light-emitting diode.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101157
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    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Quantum well emission transistor with tunneling output current (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 425-429 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We propose a novel tunneling quantum well emission transistor (TQWET), in which the gate-induced modulation of the Fermi level in the quantum well leads to a strong variation of the tunneling current to the collector through the specially designed collector barrier. The device is calculated to possess a high transconductance and a large current drive. Low-temperature utilization of the transistor implies a high electron mobility in the quantum well (QW) and, therefore, low lateral resistance along the QW, a major current and speed limitation of the device. With this limitation taken into account, the TQWET shows the delay times ∼1.4 and 1.5 ps for temperatures 10 and 77 K, respectively.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.343840
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Theory of the quantum well emission transistor (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 821-829 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a theoretical analysis of the physical processes and high-speed performance of the recently proposed quantum well emission transistor employing quantum properties of electrons in a single quantum well (QW). The physical mechanism of device operation is based on an exponentially strong variation of the thermionic emission from the QW to the collector induced by the charge density modulation in the QW by the gate voltage. The calculation is performed for the selected structure optimized for the highest device performance.The most essential part of calculation is related to the effect of collector and gate voltages on the ground-state energy in the QW. A variational approach is used to take into account the presence of electrons in the QW. The analysis presented shows a high potential of this device for high-speed, large current drive applications.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.343072
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    New negative differential resistance effects in the negative resistance field-effect transistor (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 2186-2188 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report two new effects of negative differential resistance in the modulation-doped AlGaAs/GaAs negative resistance field-effect transistor. Both effects are well controlled by a third electrode. Presence of a top n+ AlGaAs layer causes a hot-electron real-space transfer to this layer, and prevents the electron transfer to the collector. Creation of the high-field domain in the source-drain channel is needed to activate the hot-electron injection to the collector. The real-space transfer to the top n+AlGaAs layer, combined with the quenching of the high-field domain by the collector bias, are responsible for the appearance of the observed new negative differential resistance effects.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.344316
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    Paper (German National Licenses)
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