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  • 1995-1999  (4)
  • Polymer and Materials Science  (3)
  • Cha4p  (1)
  • 32.80.Fb
  • 1
    ISSN: 1617-4623
    Keywords: Key words Yeast ; Transcriptional activator ; Cha4p ; Serine/threonine deaminase ; Isoleucine biosynthesis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract The ILV1 gene of Saccharomyces cerevisiae encodes the anabolic threonine deaminase, which catalyzes the first committed step in isoleucine biosynthesis. Strains devoid of a functional Ilv1p have a requirement for isoleucine. Threonine can also be deaminated by a second serine/threonine deaminase encoded by the CHA1 gene. CHA1 is regulated by transcriptional induction by serine and threonine, and enables yeast to utilize the hydroxyamino acids as sole nitrogen source. Phenotypic suppression of ilv1 can occur by inducer-mediated transcriptional activation of the CHA1 gene. To identify mutations in putative trans-acting factors regulating CHA1 expression, we have isolated and characterized three extragenic suppressors of ilv1. A dominant mutation, SIL4 (suppressor of il v1), is allelic to HOM3. It increases the size of the threonine pool, by 15- to 20-fold, which is sufficient to induce CHA1 transcription, thereby creating a metabolic bypass of ilv1. A second dominant mutation, SIL3, and a recessive mutation, sil2, both suppress ilv1 by causing inducer-independent, constitutive transcription of CHA1. Importantly, sil2 and SIL3 increase the expression of a CHA1p–lacZ translational gene fusion, demonstrating that they exert their action through the CHA1 promoter. Genetic analysis showed that both SIL3 and sil2 are alleles of CHA4, a positive regulator of CHA1, i.e., they convert Cha4p to a constitutive activator.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 717-722 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An analytical correction method is proposed to eliminate the problems resulting from numerical Fourier transformation of functions with a broad background. The method incorporates the analytically known or observed asymptotic behaviour into the numerical procedure. The applicability and high accuracy of the background correction method is illustrated by application to the analysis of reflected electron energy-loss spectra.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 753-763 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The accuracy by which an unknown concentration profile can be found by analysis of XPS spectra is investigated theoretically by analytical and numerical techniques. The problem of determining the profile is reformulated as an optimization problem. By use of analytical techniques we obtain qualitative statements about the depth resolution and we derive fundamental relationships between the different parameters that indicate their relative importance. In order to illustrate the various dependencies of the variability of the model parameters, we derive analytical expressions for the standard errors of the model parameters for two simple models: a dalta layer and an exponentially decreasing profile. Furthermore, the complete probability distribution of the model parameters for a rectangular model is investigated numerically.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 23-27 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: It is shown that the accuracy by which a concentration-depth profile can be estimated from the inelastic background of an XPS spectrum is dramatically improved by using two-dimensional (2D) data. The energy loss distribution of the photoelectrons for several values of the detection angle, or the energy of the excitation source, are treated as a single 2D data set. The resolution of the depth profile estimated from this set is far better than can be obtained from any single XPS spectrum.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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