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  • 1995-1999  (4)
  • Polymer and Materials Science  (3)
  • GIS  (1)
  • 32.80.Fb
  • 1
    ISSN: 1573-2959
    Keywords: air pollution ; GIS ; lichens ; remote sensing ; SO2 ; terrestrial ecosystems
    Source: Springer Online Journal Archives 1860-2000
    Topics: Energy, Environment Protection, Nuclear Power Engineering
    Notes: Abstract Transboundary air pollution from industries in Nikel and Zapolyarnij has caused severe damage to the environment in Southern-Varanger in Norway and in Pechenga municipality in Russia. The work presented in this paper focuses on the integration of in-situ air pollution data with remote sensing based land cover maps. Land cover maps have been utilised to detect changes in the major land cover types within the area. The major change in the environment was the decrease of the sensitive lichen-dominated land cover types, and the increase of bilberry-dominated land cover types and finally the increase of the land cover types with the greatest air pollution stress (industrial barren, barren, and partly damaged vegetation, defoliated forests, lichen removal). A GIS based method for assessing the relationship of the remotely sensed land cover maps with the environmental condition parameters was developed and applied. By comparing the results from this analysis we observed that the land cover types with the greatest stress had the largest concentrations of SO2 in the ground air layer, while the land cover types with minor damage (the remaining lichen-dominated vegetation) had rather low concentrations of sulphur dioxide in the ground air layer. The area of the land cover types with the greatest stress (industrial barren, barren and partly damaged vegetation) has increased in the period 1973–1988, and the degradation is carried out in a such manner that sensitive mountain and lichen vegetation formations have been transformed into a more barren-like environment. The increase in the emissions has also transferred the natural barrens which also consisted of some sparse vegetation into a complete barren with little vegetation left. Also the epilitic lichens and mosses on bare rocks and stones were also removed by the high concentrations of SO2. The land cover types with minor damage (with the remaining lichen-dominated vegetation) had rather low concentrations of the contaminants (SO2, Ni and S), while the partly damaged and damaged land cover types had the highest concentrations of the contaminants. An exception was the Ni and S concentrations found in class 11 Industrial barrens which were lower than expected. Associations between the degradation and the SO2 concentration in the air were also documented. The conclusion from this analysis is that the in-situ data support the observations of damaged vegetation and industrial barrens imaged by the Landsat satellites, especially in the surroundings of Nikel and Zapolyarnij.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 753-763 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The accuracy by which an unknown concentration profile can be found by analysis of XPS spectra is investigated theoretically by analytical and numerical techniques. The problem of determining the profile is reformulated as an optimization problem. By use of analytical techniques we obtain qualitative statements about the depth resolution and we derive fundamental relationships between the different parameters that indicate their relative importance. In order to illustrate the various dependencies of the variability of the model parameters, we derive analytical expressions for the standard errors of the model parameters for two simple models: a dalta layer and an exponentially decreasing profile. Furthermore, the complete probability distribution of the model parameters for a rectangular model is investigated numerically.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 23-27 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: It is shown that the accuracy by which a concentration-depth profile can be estimated from the inelastic background of an XPS spectrum is dramatically improved by using two-dimensional (2D) data. The energy loss distribution of the photoelectrons for several values of the detection angle, or the energy of the excitation source, are treated as a single 2D data set. The resolution of the depth profile estimated from this set is far better than can be obtained from any single XPS spectrum.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 717-722 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An analytical correction method is proposed to eliminate the problems resulting from numerical Fourier transformation of functions with a broad background. The method incorporates the analytically known or observed asymptotic behaviour into the numerical procedure. The applicability and high accuracy of the background correction method is illustrated by application to the analysis of reflected electron energy-loss spectra.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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