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Characterization of solid hydrogen targets (1996)

Fujiwara, M. C. ; Bailey, J. M. ; Beer, G. A. ; [et al.]

Springer

Hyperfine interactions 101-102 (1996), S. 641-646

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ISSN: 1572-9540

Keywords: muon-catalyzed fusion ; thickness measurement ; solid hydrogen

Source: Springer Online Journal Archives 1860-2000

Topics: Physics

Notes: Abstract In experiments using the TRIUMF solid hydrogen target system, the knowledge of the target thickness and uniformity is often essential in order to extract physical parameters from the data. We have characterized the thickness and uniformity of frozen targets using the energy loss of alpha particles. An accuracy of ∼5% was achieved, a limit imposed by the uncertainty in the stopping powers: The details of the method are described, and the thickness calibration of the target is presented.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF02227677

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New effects in low energy scattering of pµ atoms (1999)

Woźniak, J. ; Adamczak, A. ; Beer, G.A. ; [et al.]

Springer

Hyperfine interactions 119 (1999), S. 63-69

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ISSN: 1572-9540

Keywords: scattering ; muons ; muonic hydrogen ; solid hydrogen

Source: Springer Online Journal Archives 1860-2000

Topics: Physics

Notes: Abstract Strong solid state effects in low energy scattering of pµ atoms in solid hydrogen are reported and analyzed. Such effects have been observed in TRIUMF experiment E742 where muons are stopped in thin frozen (3 K) layers of hydrogen. Emission of low energy pµ atoms from the hydrogen layer into adjacent vacuum was much higher than expected, based on calculations which ignored the solid nature of hydrogen. Monte Carlo simulations, performed using the scattering cross-sections with solid state effects taken into account, show the important role of the coherent elastic Bragg scattering in the diffusion of pµ atoms. For pµ energies lower than the Bragg cut-off limit (∼2 meV) the total scattering cross-section falls by several orders of magnitude, the hydrogen target becomes transparent and the emission of cold pµ atoms takes place.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1023/A:1012602501617

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Secondary ion mass spectrometry round-robin study of relative sensitivity factors in gallium arsenide (1998)

Homma, Y. ; Tohjou, F. ; Masamoto, A. ; [et al.]

Chichester [u.a.] : Wiley-Blackwell

Surface and Interface Analysis 26 (1998), S. 144-154

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ISSN: 0142-2421

Keywords: SIMS ; GaAs ; round-robin ; sensitivity factor ; Chemistry ; Polymer and Materials Science

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Physics

Notes: Round-robin studies on relative sensitivity factors (RSFs) in secondary ion mass spectrometry (SIMS) were conducted using bulk GaAs samples uniformly doped with various impurity elements. A total of 31 laboratories participated in two round-robins. More than 30 sets of relative ion intensities were obtained for B, Si, Cr, Mn, Fe, Cu, Zn, In and Te in GaAs. The RSFs for both positive and negative ions were derived for several types of SIMS instruments. The effect of primary ion incident angle was examined using quadrupole-based instruments and found to be the determining factor of the instrumental dependence of RSF. © 1998 John Wiley & Sons, Ltd.

Additional Material: 6 Ill.

Type of Medium: Electronic Resource

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