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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    European journal of pediatrics 154 (1995), S. 222-224 
    ISSN: 1432-1076
    Keywords: Oximetry ; Hyperoxaemia ; Preterm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract When deciding an appropriate upper limit for pulse oxygen saturation (SpO2) in preterm infants the usefuleness of current data is limited by the fact that previous studies have examined a population of more mature infants and children or have applied various exclusion criteria which produce results unrepresentative of clinical practice. We tested the hypothesis of previous workers that maintaining the SpO2 below 98% would ensure an arterial oxygen tension (PaO2) less than 12 kPa. A total of 477 simultaneous measurements ofPaO2 and SpO2 were made using Ohmeda Biox oximeters on 43 infants who were less than 33 weeks gestation and receiving supplementary oxygen. Of 435 measurements performed when the SpO2 was 97% or less, 26 (6%) had aPaO2 greater than 12 kPa. Further examination of the data showed that of 108 estimations performed when the SpO2 was less than 94%, none had aPaO2 greater than 12kPa. Conclusion When using Ohmeda Biox pulse oximeters an upper limit of 97% for SaO2 is not effective in preventing hyperoxaemia; however, a linit of 93% is likely to maintain thePaO2 below 12 kPa.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 7 (1997), S. 1-8 
    ISSN: 1057-9257
    Keywords: CdTe ; iodine doping ; electrical activity ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: The electrical activity of iodine in CdTe is discussed when iodine is introduced into the CdTe by diffusion from the vapour phase. It is compared both with the total concentration of iodine in the diffused CdTe slices and with the electrical activity in CdTe slices which have been annealed under Cd- and Te-saturated vapour pressures.Iodine-diffused slices of CdTe were profiled by secondary ion mass spectrometry (SIMS) to obtain the total iodine concentration and by capacitance-voltage (C-V) techniques to obtain the net concentration of electrically active iodine. After annealing with iodine in the form of Cdl2, the slices were p-type, similar to those obtained when CdTe was annealed in either excess Te or Cd vapour, and they showed no significant increase in electrical activity. If Cd was added to the Cdl2 diffusion source or the CdTe was given a subsequent anneal in cadmium vapour, the slices became n-type. The results indicated that in all cases a neutral layer composed of Cd nIm (m and n are integers) formed on the surface layers, whereas if Cd was involved in the diffusion, some of the iodine existed in an electrically active form deeper into the slice with a maximum concentration of active carriers given by ND - NA ≈ 1017 cm-3. © 1997 John Wiley & Sons Ltd.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 5 (1995), S. 157-161 
    ISSN: 1057-9257
    Keywords: CdTe ; iodine doping ; diffusion ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Studies on the diffusion of iodine into CdTe at a temperature of 20°C using four widely differing types of diffusion sources are compared and discussed. The concentration profiles were measured using either a radiotracer sectioning (RTS) technique or secondary ion mass spectrometry (SIMS).The profiles were composed of four parts to which a computer package consisting of the sum of four complementary error functions (erfc) gave accurate fits, providing four empirical values of the diffusivity. The diffusivities for the fastest component in all four cases were in agreement (∼2 × 10-14 cm2 s-1) and were consistent with previously published data. These results indicate that when iodine is diffused from the vapour it is not a suitable long-termstable dopant in devices where sharp junctions are required.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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