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Field mapping with the magnetic resonance force microscope (1999)

Ruskell, Todd G. ; Löhndorf, Markus ; Moreland, John

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 86 (1999), S. 664-670

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: We have developed magnetic resonance force microscopy for quantitative measurements of magnetic fields. A microscopic particle attached near the end of a microcantilever serves as the field sensing probe. We have demonstrated two-dimensional field mapping with a lateral resolution of 3.2 μm and a field resolution of 0.19 mT (1.9 G). The instrument holds considerable promise for field mapping with spatial resolution better than 0.1 μm at room temperature. Applications include field mapping of magnetic recording heads. © 1999 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.370781

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