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  • 1990-1994  (4)
  • 1965-1969  (6)
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 234-242 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A machine is described which allows bicrystals of metals and ceramics to be made by pressure bonding at temperatures up to 1500 °C in ultrahigh vacuum (UHV). The mutual orientation of the two component crystals can be adjusted to within 0.1°. The surfaces to be bonded can be sputter cleaned with Ar ions while monitoring by Auger electron spectroscopy, and dopants can be applied by evaporation in a separate chamber. The machine allows the production of bicrystals with interfaces of precisely defined crystallography and chemistry. The specimen size is sufficient for fracture mechanical characterization of interface strength. The performance of the machine is illustrated with data for niobium-sapphire bicrystals. The machine has been shown to produce bicrystal interfaces whose purity is not measurably impaired by atmospheric contaminants. Fracture resistant levels of Nb-Al2O3 interfaces bonded at 1700 °C in ordinary high vacuum are reached in the UHV machine already at 1000 °C. Going to temperatures around 1450 °C raises the fracture resistance to more than twice the level obtained in ordinary high vacuum at 1700 °C.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of agricultural and food chemistry 14 (1966), S. 437-440 
    ISSN: 1520-5118
    Source: ACS Legacy Archives
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Naturwissenschaften 52 (1965), S. 55-55 
    ISSN: 1432-1904
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Chemistry and Pharmacology , Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Mathematische Annalen 174 (1967), S. 265-268 
    ISSN: 1432-1807
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Mathematische Annalen 175 (1967), S. 243-252 
    ISSN: 1432-1807
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Mathematische Annalen 178 (1968), S. 154-168 
    ISSN: 1432-1807
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Materialwissenschaft und Werkstofftechnik 21 (1990), S. 113-115 
    ISSN: 0933-5137
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Bei der Entwicklung mehrphasiger, hochleistungsfähiger und temperaturbeständiger keramischer Werkstoffe spielt die analytische Transmissionselektronenmikroskopie (TEM) eine wichtige Rolle. Zwei sich ergänzende, quantitative Untersuchungsmethoden stehen dabei dem Materialwissenschaftler zur Verfügung. Die energiedispersive Röntgenanalyse [1] (EDX, energy dispersive X-ray spectroscopy) eignet sich zum Nachweis und zur Ermittlung der Konzentrationen von mittelschweren bis schweren Elementen, während sich mit der Elektronenenergieverlustspektroskopie [2] (EELS, electron energy loss spectroscopy) gerade sehr leichte bis mittelschwere Elemente nachweisen und quantitativ erfassen lassen. Ein schneller, qualitativer Überblick über die Zusammensetzung des Materiales kann dabei mit beiden Methoden erhalten werden. Eine zuverlässige quantitative Analyse erfordert jedoch häufig Erfahrung und setzt die Einsicht in die physikalischen Grundlagen, die Möglichkeiten und Grenzen der Analyseverfahren voraus. So können diese Methoden bezüglich der Genauigkeit und Nachweisgrenze nicht mit anderen Verfahren wie z. B. der Röntgenfloureszenzanalyse (RFA) konkurrieren. Ein großer Vorteil ist jedoch das hohe räumliche Auflösungsvermögen, das Analysen von 10 bis 20 nm großen Bereichen gestattet.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Materialwissenschaft und Werkstofftechnik 21 (1990), S. 139-140 
    ISSN: 0933-5137
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 794-796 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Sputter-deposited multilayers of Si and Ta with a nominal period length of a double layer (Ta + Si) of 20 nm were studied with AES depth profiling and with transmission electron microscopy (TEM). The asymmetric shape of the measured Si layer profiles was fitted to model calculations based on preferential sputtering of Si and an atomic mixing zone length of 4 nm for 3 keV Ar+ ions at a 36° incidence angle. TEM images of cross-sections of the original sample show sharp Si/Ta and Ta/Si interfaces, with a width of ∼ 0.5 nm. The atomic mixing zone length of the sputter-profiled sample was observed directly by TEM and was determined to be 4.0 nm, in accordance with the AES profile evaluation. It is concluded that the observed asymmetric broadening of the shape of the measured AES sputtering profiles is due mainly to atomic mixing and is enhanced by preferential sputtering of Si.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Zeitschrift für anorganische Chemie 351 (1967), S. 146-151 
    ISSN: 0044-2313
    Keywords: Chemistry ; Inorganic Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Preparation and properties of compounds with the complex anions [Pt(JO6)2]6- and [Pd(JO6)2]6- are described, namely K6[Pt(JO6)2] · 12 H2O, K6[Pt(JO6)2] · KOH · 14 H2O, K3H3[Pt(JO6)2] · 22 H2O, Na6[Pt(JO6)2] · 20 H2O and K6[Pd(JO6)2] · KOH · 12 H2O. In these complexes the periodate ion is a tridentate ligand. Periodato complexes of Pt(II) and Pd(II) have not been obtained.
    Notes: Es werden Darstellung und Eigenschaften von Salzen mit den komplexen Anionen [Pt(JO6)2]6- und [Pd(JO6)2]6- beschrieben, worin das Perjodat als dreizähliger Ligand fungiert. Erhalten wurden K6[Pt(JO6)2] · 12 H2O, K6[Pt(JO6)2] · KOH · 14 H2O, K3H3[Pt(JO6)2] · 22 H2O, Na6[Pt(JO6)2] · 20 H2O und K6[Pd(JO6)2] · KOH · 12 H2O. Perjodato-Komplexe von Pt(II) und Pd(II) konnten nicht erhalten werden.
    Type of Medium: Electronic Resource
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