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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 52 (1991), S. 28-32 
    ISSN: 1432-0630
    Keywords: 42.10.Fa ; 07.60.Hv ; 78.70.Ck
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The Refracted X-ray Fluorescence (RXF) method can obtain the information about surfaces and interfaces: for example, surface electron density, chemical condition and surface roughness. We evaluated surfaces and interfaces of ultrathin films by using RXF method, and we measured the average lattice constant of a ultrathin GaAs film, the top-layer of a GaAs substrate and the surface roughness of the Si substrate below a ultrathin GaAs film grown by MBE.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1432-1920
    Keywords: Dural arteriovenous malformation ; Posterior cranial fossa ; Varix ; Computed tomography ; Magnetic resonance imaging ; Thrombosed aneurysm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Summary Dural arteriovenous malformations (AVMs) in the posterior cranial fossa are relatively infrequent. Intradural haemorrhage is one of their specific complications. Angiographic demonstration of varices or aneurysmal structures is one of the hallmarks of severe cases. We report a patient with posterior cranial fossa dural AVM associated with a varix mimicking a thrombosed aneurysm on CT and MRI. Internal carotid and vertebral angiography failed to demonstrate an aneurysm, but external carotid injection revealed a dural AVM affecting the sigmoid sinus, and a varix. The AVM was completely eliminated by embolization. When a dural AVM is suspected clinically selctive angiography should be performed to confirm the diagnosis even when CT or MRI do not show dilated vessels.
    Type of Medium: Electronic Resource
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