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  • 1
    Electronic Resource
    Electronic Resource
    Zn drops at a Si surface measured by the refracted x-ray fluorescence method (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 8420-8422 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Si and Zn are essentially mutually insoluble. We were able to detect Zn drops at a Si surface by using the refracted x-ray fluorescence method when the Si wafer was implanted with Zn ions at 50 keV up to doses of 1 × 1016 cm−2. The presence of the Zn drops at the Si surface was confirmed both by measuring surface roughness and Rutherford-backscattering spectroscopy spectra.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347411
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  • 2
    Electronic Resource
    Electronic Resource
    Observation of x-ray sheet beam from radioisotopes embedded in thin-film waveguide (1995)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 164-166 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A specific angular distribution of x rays from 111In embedded in a thin-film waveguide (Au film/Langmuir–Blodgett film/Au substrate) is observed by a non-energy-dispersive two-dimensional detector (imaging plate). The angular distribution for the thickness of the upper Au layer of 90 A(ring) can be explained by normal calculation of the optical electromagnetic wave solution of Maxwell's equations for each interface and reciprocity. However, the angular pattern in the upper 400 A(ring) Au thickness layer cannot be accounted for by the normal approach without considering the intensity of the x-ray sheet beam emerging from the end of the multilayer. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.114654
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  • 3
    Electronic Resource
    Electronic Resource
    Time-resolved fluorescent X-ray interference (1998)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 1075-1078 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A fluorescent X-ray interference method can effectively measure nanometer-level conformational changes for non-crystallized molecules and proteins in aqueous conditions. The time-resolved technique can be used to obtain information about the dynamics of molecules and proteins. Instrumentation for time-resolved fluorescent X-ray interference has been designed. A typical interference-fringe pattern was observed with approximately 3 s of X-ray exposure time from K-fluorescent X-rays emitted from a Zn monoatomic layer on an Rh substrate. The primary X-ray beam was polychromed with a mirror for total external reflection of X-rays and was tuned to an energy level at which only Zn K radiation became optimally excited. The glancing angle of the primary X-ray beam was fixed at a glancing angle at which the total intensity of K-fluorescent X-rays emitted from Zn atoms corresponded to the maximum value. The fluorescent X-ray interference fringes were monitored with an imaging plate (IP) as a non-energy-dispersive two-dimensional detector. The exposed interference fringes on the IP were integrated along the direction of the fringes. The integrated fringes were in close agreement with a theoretical estimate based on the interference among transmitted and reflected waves at interfaces in the sample.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049598002787
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  • 4
    Electronic Resource
    Electronic Resource
    Refracted X-ray Fluorescence (RXF) on Si single crystal and GaAs (1991)
    Springer
    Applied physics 52 (1991), S. 28-32 
    Details
    ISSN: 1432-0630
    Keywords: 42.10.Fa ; 07.60.Hv ; 78.70.Ck
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The Refracted X-ray Fluorescence (RXF) method can obtain the information about surfaces and interfaces: for example, surface electron density, chemical condition and surface roughness. We evaluated surfaces and interfaces of ultrathin films by using RXF method, and we measured the average lattice constant of a ultrathin GaAs film, the top-layer of a GaAs substrate and the surface roughness of the Si substrate below a ultrathin GaAs film grown by MBE.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00323681
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  • 5
    Electronic Resource
    Electronic Resource
    Structural information from the interference effect of electron-capture X-rays (1999)
    Springer
    Journal of radioanalytical and nuclear chemistry 239 (1999), S. 341-344 
    Details
    ISSN: 1588-2780
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Notes: Abstract We observed the interference effect of electron-capture X-rays emitted by the nuclear transformations in radioisotopes. This interference is between the direct monochromatic emission from the radioactive atoms and the emission totally reflected by the substrate surface. Nanometer-level structural information about the radioactive atoms can be obtained by analyzing the measured interference fringes because the period of these fringes depends on the position of the radioactive atoms relative to the substrate surface. In this work, we used the functional protein molecules (myosin subfragment 1 (S1)) which were radioiodinated with no carrier added125I to observe the conformational changes in aqueous solutions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02349508
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