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  • 1990-1994  (2)
  • AES  (1)
  • Fracture healing  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Fracture healing: direct magnification versus conventional radiography (1994)
    Springer
    European radiology 4 (1994), S. 341-346 
    Details
    ISSN: 1432-1084
    Keywords: Fracture healing ; Magnification radiography ; Roentgen technique
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract The aim of the study was to evaluate the potential of magnification radiography in diagnosing fracture healing and assessing its complications. Seventy-three patients with fractures or who had undergone osteotomy were radiographed with both conventional (non-magnified) and magnification (5-fold) techniques. Since 10 patients were radiographed twice and 1 three times, 83 radiographs using each technique were obtained. All radiographs were analysed and the findings correlated with the patients' follow-up studies. The microfocal X-ray unit used for magnification radiography had a focal spot size of 20–130 μm. As an imaging system, digital luminescence radiography was employed with magnification, while normal film-screen systems were used with conventional radiography. Manification radiography proved superior to conventional radiography in 47% of cases: endosteal and periosteal callus formations were sen earlier and better in 26 cases, and osseous union could be evaluated with greater certainty in 33 cases. In 49% of cases magnification radiography was equal and in 4% inferior to conventional radiography. Additionally an “inter-observer analysis” was carried out. Anatomical and pathological structures were classified into one of four grades. Results were significantly (P 〈 0.01) better using magnification radiography. We conclude that the magnification technique is a good method for monitoring fracture healing in its early stages.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00599068
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Oxidation of copper by fast atomic oxygen (1994)
    Springer
    Oxidation of metals 42 (1994), S. 1-15 
    Details
    ISSN: 1573-4889
    Keywords: XPS ; AES ; XRD ; profilometry ; reflectance
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The surface composition of the oxide formed on thin-film and solid OFHC copper samples exposed to a fast-atomic-oxygen environment in a low-earth orbit on NASA's Long Duration Exposure Facility (LDEF) was investigated using X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), thin-film X-ray diffraction (TF-XRD), high-resolution profilometry, and reflectance measurements. The results confirm that it is easier to form thick copper oxide layers in the atomic oxygen ambient than is normally possible with other laboratory-based techniques.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01061921
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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