ISSN:
1573-4889
Keywords:
XPS
;
AES
;
XRD
;
profilometry
;
reflectance
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The surface composition of the oxide formed on thin-film and solid OFHC copper samples exposed to a fast-atomic-oxygen environment in a low-earth orbit on NASA's Long Duration Exposure Facility (LDEF) was investigated using X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), thin-film X-ray diffraction (TF-XRD), high-resolution profilometry, and reflectance measurements. The results confirm that it is easier to form thick copper oxide layers in the atomic oxygen ambient than is normally possible with other laboratory-based techniques.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01061921
