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  • 11
    Electronic Resource
    Electronic Resource
    The present and future of high-resolution electron microscopy (1987)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 43 (1987), S. 737-751 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: High-resolution electron microscopy, with the current resolution limits of better than 2 Å, has been proven to be a valuable technique for the study of radiation-resistant crystals, allowing the determination of the structures of perfect crystal regions, crystal defects and crystal surfaces with atomic resolution. As the resolution is improved, however, the image contrast is increasingly determined by dynamical diffraction effects and it is increasingly sensitive to the instrumental parameters and to the geometry and alignment of the specimen. For both the conventional transmission electron microscope and the scanning transmission electron microscope, further developments should lead to better or more versatile performance, up to the limits set by the fundamental problems of radiation damage. Major advances may be expected from developments of the associated techniques of microanalysis and microdiffraction. Applications of particular interest will include studies of surfaces and interfaces, small particles and radiation-induced chemical reactions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S010876738709857X
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  • 12
    Electronic Resource
    Electronic Resource
    Electron-microscope imaging of short-range order in disordered alloys (1987)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 43 (1987), S. 337-346 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Dynamical diffraction effects of diffuse scattering due to point defects in crystals and the associated imaging are studied in relation to imaging of the short-range order in disordered alloys through theoretical formulations and computer image simulations. Simulations of gold crystals including one point defect without strain show that the image contrast is localized in atomic size and relatively insensitive to the defect depth when the total thickness is fixed. The contrast from a small number of defects in an atomic column can be simply related to the number of defects by a nonlinear expression. An approximate imaging theory for short-range order in disordered binary alloys is discussed. The present study shows that the important parameters for observations of defective crystals are total thickness and microscope defocus, but not the defect depth. With controlled values of these parameters and sample conditions, the images of disordered binary alloys can be interpreted semi-quantitatively.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767387099318
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  • 13
    Electronic Resource
    Electronic Resource
    Electron inelastic plasmon scattering and its resonance propagation at crystal surfaces in RHEED (1989)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 45 (1989), S. 325-333 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The modified multislice theory [Wang (1989). Acta Cryst. A45, 193-199] has been employed to calculate the electron reflection intensity with and without considering the plasmon diffuse scattering in the geometry of reflection high-energy electron diffraction (RHEED). It has been shown that the inelastic scattering can greatly enhance the reflectance of a surface, depending critically on the incident conditions of the electrons. At some incidences, the inelastic resonance reflection is enhanced, which is considered as the 'true' surface resonance state. This happens within a very narrow angular range (〈1 mrad). For 'true' resonance states, the inelastic intensity is much stronger than for other conditions as shown both theoretically and experimentally. The enhancement of the reflection intensity may not be the proper criterion for identifying the 'true' surface resonance. Besides the surface plasmon peaks, an 'extra' peak, located at 4.5 eV, is observed in the reflection electron energy-loss spectroscopy (REELS) study of the 'true' resonance of GaAs (110) surface. This is considered as a characteristic of the resonance propagations of the electrons along the surface and may result from the generation of resonance radiation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767388014539
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  • 14
    Electronic Resource
    Electronic Resource
    High-resolution electron microscopy of disordered Au–15at.%Mn alloys (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 43 (1987), S. 41-48 
    Details
    ISSN: 1600-5740
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S010876818709832X
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  • 15
    Electronic Resource
    Electronic Resource
    Refraction Effects in Electron Diffraction (1946)
    [s.l.] : Nature Publishing Group
    Nature 158 (1946), S. 550-551 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] OBSERVATIONS by Sturkey and Frevel1 and Hillier and Baker2 indicate that some rings in electron diffraction patterns from magnesium oxide and cadmium oxide smokes are double, and in one case (the 220 ring) it was suspected that there were five components ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/158550c0
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  • 16
    Electronic Resource
    Electronic Resource
    X-Ray Diffraction Studies of Yielding in Mild Steel (1947)
    [s.l.] : Nature Publishing Group
    Nature 159 (1947), S. 846-846 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] THE distribution of plastic deformation in a cold-stretched mild steel bar has been studied by X-ray diffraction methods. Using the back-reflexion technique with cobalt radiation, two spotty rings were obtained by reflexion of the Kα doublet from the (310) planeof iron. Plastic deformation in ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/159846a0
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  • 17
    Electronic Resource
    Electronic Resource
    Electron diffraction phenomena observed with a high resolution STEM instrument (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 3 (1986), S. 25-44 
    Details
    ISSN: 0741-0581
    Keywords: Electron diffraction ; Scanning transmission electron microscopy ; Microdiffraction ; In-line holography ; Small particles ; Crystal structure ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Because of the high brightness of the cold field emission source used in a dedicated scanning transmission electron microscopy (STEM) instrument, it is possible to focus electrons to a cross-over of width 3Å or less and, with a suitable detection system, to obtain diffraction patterns from specimen regions of this size or greater. Coherent interference effects are visible in shadow images (in-line holograms) and in convergent beam diffraction patterns. Special techniques have been developed for gathering information from the diffraction patterns for application to the study of the structures of crystal defects, crystal surfaces and small particles. Possibilities have been explored for holographic reconstruction from shadow images.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060030105
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  • 18
    Electronic Resource
    Electronic Resource
    Effects of the coherence of illumination on electron microdiffraction pattern intensities (1987)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 7 (1987), S. 177-183 
    Details
    ISSN: 0741-0581
    Keywords: Coherence width ; Field emission guns ; Out-of-phase domain boundaries ; Spot splitting microdiffraction ; Electrical instabilities ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Microdiffraction is capable of revealing the local structure within an area of the specimen consisting of only a few, or a few tens of, unit cells. However, the extent to which the diffraction pattern intensities can show the local structure depends strongly on the coherence of the illumination. If the coherence width of the illumination is smaller than the diameter of the electron probe at the specimen level, the details within the diffraction spots, which indicate deviations of the local structure from the periodicity of the crystal, will be lost. The differences in the amount of spot splitting observed in microdiffraction patterns from out-of-phase domain boundaries, observed with two instruments, are attributed to differences in the effective source sizes.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060070305
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  • 19
    Electronic Resource
    Electronic Resource
    Geometric analysis of surface resonance conditions in reflection high energy electron diffraction (1987)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 6 (1987), S. 43-53 
    Details
    ISSN: 0741-0581
    Keywords: Ewald sphere ; Refraction ; Specular reflection ; Double diffraction ; Diffraction geometry ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A three-dimensional analysis in reciprocal space is used to analyse reflection high energy electron diffraction (RHEED) patterns. Particular emphasis is placed on investigating the surface resonance phenomenon, the resonance conditions, and the diffraction mechanisms. The surface resonance regions defined by the resonance beam threshold conditions are related to the limits for the specular reflection spot in the diffraction pattern. The introduction of an Ewald sphere of varying radius is shown to be useful in understanding the surface phenomenon. Simulations based on the geometric theory, taking account of the surface refraction effect, describe very well the RHEED pattern geometry from the (111) surface of a platinum single crystal.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060060107
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  • 20
    Electronic Resource
    Electronic Resource
    Observation of microdiffraction patterns with a dedicated STEM instrument (1989)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 11 (1989), S. 143-154 
    Details
    ISSN: 0741-0581
    Keywords: Detector systems for microdiffraction ; STEM imaging ; Coherent diffraction effects ; Image reconstruction from diffraction patterns ; EELS ; SEM ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A two-dimensional detector system, designed for the observation and recording of microdiffraction patterns formed in an HB 5 scanning transmission electron microscope (STEM) is described and discussed. Possibilities are described and demonstrated for the simultaneous or successive recording of microdiffraction patterns from regions of diameter 3 å or more, bright- or dark-field STEM images, EELS spectra, secondary electron images, and in-line holograms. Applications of the system have been made to studies of catalyst particles, reflection-mode imaging of bulk surfaces, and image reconstruction from microdiffraction patterns obtained from each point of a STEM image.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060110209
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