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  • 1
    Electronic Resource
    Electronic Resource
    Magnetic properties of sputtered Fe thin films: Processing and thickness dependence (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1233-1241 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The microstructure and magnetic properties of polycrystalline Fe films with thicknesses of 200–1000 A(ring) have been investigated. The films were prepared by rf sputtering onto SiO2 substrates. The investigation was prompted by the lack of data on sputtered Fe films in this thickness regime as well as disagreement in the data for evaporated films. In addition to thickness, substrate temperature and deposition pressure were varied to examine their effect on the microstructure. The film microstructure was characterized by x-ray diffraction, transmission electron microscopy, and Auger spectroscopy. The polycrystalline films did not display a strong preferred orientation and had average grain sizes of 60–85 A(ring). Surface oxide layers formed upon exposure to air ranged from 10 to 80 A(ring), the thicker oxides formed on films with lower density. Magnetic hysteresis measurements were made with a vibrating sample magnetometer. Below 1000 A(ring), porosity and surface oxidation result in reductions up to 25% in the saturation magnetization. An anomalous peak in coercivity at film thicknesses of 300–500 A(ring) was observed, which can be explained by the change in domain wall type.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354926
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  • 2
    Electronic Resource
    Electronic Resource
    Processing-properties relationships in Fe3O4 thin films (abstract) : 37th annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 6313-6313 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: As part of a fundamental study of interface magnetism in Fe/Fe3O4 multilayer systems, we have examined the magnetic properties of polycrystalline Fe3O4 thin films. Fe3O4 thin films, deposited by reactive evaporation and sputtering, have been previously studied because they serve as a precursor for the formation of γ-Fe2O3. The film thicknesses used in these studies have typically been greater than 100 nm. We have examined the magnetic properties and microstructure of Fe3O4 films with thicknesses less than 100 nm, a regime in which the magnetic properties have been reported to be strongly dependent on thickness.1 The films were deposited by rf sputtering. The processing variables examined include substrate material, substrate temperature, oxygen partial pressure, and film thickness. The microstructural origins of the observed coercivity and anisotropy will be discussed, as well as trends in the saturation behavior.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352682
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  • 3
    Electronic Resource
    Electronic Resource
    Application of a bridge circuit for an inductive critical current density measurement of superconducting thin films (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 2385-2386 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Recently, a new contactless Jc measurement technique by monitoring nonlinear responses from a coil mounted in the proximity of a superconducting film was reported by Classen et al. [Rev. Sci. Instrum. 62, 996 (1991)]. An improved method to measure the nonlinear inductive response is developed using an inductance bridge circuit, which discriminates the third-harmonic signal due to the nonlinearity from those of other origins. Moreover, in this technique, the phase of the third-harmonic signal can be used to determine the critical current.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143941
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  • 4
    Electronic Resource
    Electronic Resource
    Deposition condition and thickness dependence on magnetic properties of sputtered NiFeCo thin films : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5446-5448 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The soft magnetic properties of polycrystalline NiFeCo films have been investigated in the thickness range of 20–2400 A(ring). The films were deposited by dc magnetron sputtering, at 5 A(ring)/s, from a Ni66Fe16Co18 high purity target, and under an applied magnetic field of 85 Oe. The effects of deposition pressure on the film crystal structure and magnetic properties have been investigated via x-ray diffraction and magnetic measurements. Both easy and hard axis coercivity values decrease significantly as the deposition pressure was changed from 7 to 3 mTorr, with the corresponding effects observed in the magnetoresistance and anisotropy field values, respectively. The magnetic data at 3 mTorr showed a nonlinear behavior at thicknesses below 1000 A(ring), while at 7 mTorr the nonlinearity is present in both the low and high end thicknesses. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.362333
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  • 5
    Electronic Resource
    Electronic Resource
    Modeling effects of temperature annealing on giant magnetoresistive response in discontinuous multilayer NiFe/Ag films : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5596-5598 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The giant magnetoresistive (GMR) behaviors of discontinuous double-layer giant magnetoresistive films with different microstructure arising from different annealing conditions, are calculated using a numerical micromagnetic model. The effect of magnetic grain growths in the perpendicular and lateral directions in the magnetic layers, and the formation and growth of grain clusters were studied. The GMR responses of the films are analyzed in terms of magnetostatic interactions between the magnetic layers and the microstructural geometric effects on the transport properties of the samples. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.362253
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  • 6
    Electronic Resource
    Electronic Resource
    Simulating device size effects on magnetization pinning mechanisms in spin valves : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 6386-6388 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effects of magnetostatic interactions on the giant magnetoresistive (GMR) response of NiFe/Cu/NiFe spin valves are studied using an analytical model. The model is applicable to devices small enough for the magnetic layers to exhibit single-domain behavior. Devices having lengths in the track-width direction of 10 μm and interlayer separations of 4.5 nm are studied. Stripe heights are varied from 0.5 to 2 μm. The magnetization of one magnetic layer is pinned by a transverse pinning field that is varied from 0 to 24 kA/m (300 Oe). GMR curves for transverse fields are calculated. At zero external field the magnetization of the layers shows a tendency to align themselves antiparallel in the transverse direction. This results in an offset from the ideal biasing of the device. Broadening of the curves due to shape anisotropy occurs with decreasing stripe height and increasing magnetic layer thickness, and the magnetization in the pinned layer becomes less stable. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.362692
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  • 7
    Electronic Resource
    Electronic Resource
    Giant magnetoresistance and high sensitivity in annealed NiFeCo/Ag multilayers : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5584-5586 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report giant magnetoresistance in annealed NiFeCo (2 nm)/Ag (3.3 nm) multilayers. For all samples, post-deposition annealing was necessary for the observation of GMR analogous to the NiFe/Ag discontinuous multilayer system. The GMR ratio and field sensitivity varied widely as a function of annealing from temperatures between 300 and 400 °C. A high MR ratio of 6.3% and field sensitivity of 11.3%/(kA/m) (0.9%/Oe) were observed for a seven bilayer sample annealed to 350 °C. In general, NiFeCo/Ag multilayers produced greater MR responses and field sensitivities than comparably annealed NiFe/Ag multilayers. NiFeCo/Ag multilayers, however, display more hysteresis than NiFe/Ag multilayers and lack a zero-crossing saturation magnetostriction versus annealing temperature. Multilayer deposition in a magnetic field severely degrades MR performance since it prevents the magnetostatic antiparallel alignment between magnetic grains which occurs in the absence of an applied magnetic field following sample annealing. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.362249
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  • 8
    Electronic Resource
    Electronic Resource
    Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1573-1575 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.115703
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  • 9
    Electronic Resource
    Electronic Resource
    Surface plasmon scanning near-field optical microscopy (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 5411-5415 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have constructed a surface plasmon scanning near-field optical microscope. Surface plasmons (SP) are excited by laser light at the silver–air interface in the Kretschmann attenuated total reflection geometry. A scanning tunneling microscope or atomic force microscope tip penetrates the evanescent electromagnetic field and serves as a scatterer of the SP's which, in turn, radiate conical electromagnetic waves. The conical radiation is collected on a photodiode by an annular mirror or a fiber-optic bundle. It is shown that the SP's are predominantly scattered in the forward direction. The conical radiation intensity is recorded as a function of the tip position, creating an optical image of the silver surface. It is demonstrated that the technique's spatial resolution is determined by the tip size, rather than the wavelength of light, though the interference of the scattered SP's creates interference patterns that may present a problem. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.365568
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  • 10
    Electronic Resource
    Electronic Resource
    Temperature dependence of magnetoimpedance effect in amorphous Co66Fe4NiB14Si15 ribbon : The 7th joint MMM-intermag conference on magnetism and magnetic materials (1998)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 6575-6577 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The temperature dependence of the magnetoimpedance (MI) effect is important both for scientific study and for thermal stability of MI sensors. We have performed the measurement of MI effect in amorphous Co66 Fe4 NiB14 Si15 (Metglas 2714A) ribbon from a cryogenic chamber where the temperature of the sample can vary from 10 to 300 K. The ac current was fixed at 10 mA for all measured frequencies ranging from 100 kHz to 10 MHz. The magnetoimpedance ratio (MIR) was revealed the drastic increment as a function of MIR(T)=MIR(0)exp(cT2), where c is a constant. The measured MIR values at room temperature are usually 2–3 times larger than the data measured at 10 K for all measured frequencies. However, the shapes of the MIR curves are remained. This result shows the potential application of the MI effect for a temperature sensor. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.367605
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