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  • 1
    Electronic Resource
    Electronic Resource
    An XPS study of Cs2Te photocathode materials (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 16 (1990), S. 193-198 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The caesiation of a clean Te metal film during the formation process of a Cs2Te photocathode has been studied by X-ray photoelectron and Auger electron spectroscopies. Cs2Te is essentially an ionic compound that is stable with a large Cs excess. The ionicity increases with Cs content up to the stoichiometric composition. The Cs excess, which affects the photoemissive spectral response, cannot be reversed by Te deposition since very stable elemental Te clusters seem to be formed. CsTe has been found also during the formation process.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740160138
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Composition of oxides and nitrides from line shapes of metal core level x-ray photoelectron spectra (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 205-210 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A method is proposed which evaluates the averaged composition of a sample in terms of the centroid of the core level XP spectrum. The method is based on the basic principle of electron spectroscopy for chemical analysis, i.e. the additive property of the chemical shifts and their proportionality to the ligand co-ordination. It allows one to calculate the averaged composition of compounds if the line shapes of spectra corresponding to stoichiometric samples (including the pure metal) are known and a few simple conditions are assumed. The main advantage of this method is that the composition can be obtained even if the individual contributions of the different oxidation states cannot be resolved or deconvoluted, so that no previous knowledge of the oxidation states or co-ordination structure is necessary. This method of calculating the composition is illustrated by its application to ZrOx, HfOx, NbNx, TaNxOy and SiNxOy obtained by different methods. The results are then compared with those obtained from the usual XPS quantitative analysis, so that further insight to the sample near-surface structure and composition can be gained by this combined study.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190140
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Chemical analysis of passivated and oxidized layers on FeCr and FeTi alloys by soft x-ray absorption spectroscopy (1993)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 21-26 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The chemical differences between passivated and oxidized layers on 17.5 at.% FeCr and 5 at.% FeTi alloys are analysed by means of soft x-ray absorption spectroscopy (XAS). The relative absorption strengths were used to obtain a quantitative estimation of the composition of the layers. In FeCr, the passivated layer shows a relative Cr enrichment of 34 at.% with respect to the oxidized surface. In addition, Cr2O3 has been identified as the main oxide formed in the passivated layer of FeCr. By contrast, in FeTi, the results are consistent with the formation of a ternary oxide. The potential of XAS in the study of oxidation and passivation is discussed.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740200105
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  • 4
    Electronic Resource
    Electronic Resource
    Catalytic oxidation of Mo by caesium oxides (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 553-558 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The oxidation of a clean Mo surface with different caesium oxide overlayers has been studied by means of x-ray photoelectron spectroscopy. The results show that the presence of a caesium oxide overlayer produces enhanced oxidation of Mo at room temperature when compared with thermal oxidation, and that a layer of MoO3 is formed on top of the Mo substrate. The thickness of this MoO3 layer depends on the thickness of the caesium oxide overlayer. Also, true catalytic oxidation has been observed when the substrate with the caesium oxide overlayer is exposed to oxygen at room temperature. The interface of the MoO3 layer with the Mo metal consists of about five monolayers of Mo suboxide MoOx (with x ∼2) when the oxidation has been performed at room temperature. At moderate temperatures (∼400 K) this interface is smoother, although it tends to decrease in thickness with time. A mechanism of catalytic oxidation that is consistent with the experimental data is proposed. This mechanism is controlled by diffusion of oxygen through the caesium oxide overlayers and through the Mo substrate. Also, a diffusion of Cs towards the surface has been detected. Different phases of the type MoO3-δ can explain the chemical shifts observed in the Mo6+ XPS spectra.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.7401901103
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Chemical Analysis of Ternary Ti Oxides using Soft X-ray Absorption Spectroscopy (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 804-808 
    Details
    ISSN: 0142-2421
    Keywords: Ti oxides ; x-ray absorption spectroscopy ; electronic structure ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We measured the O 1s and Ti 2p X-Ray Absorption Spectroscopy (XAS) spectra of a series of ternary Ti oxides. The spectra of A12TiO5 are compared to those of TiO2 and the physical mixture TiO2-Al2O3. The spectra reflect important differences in the electronic structure caused by changes in the chemical bonding. It is also shown that XAS can be used to distinguish a true compound like Al2TiO5 from a stoichiometric mixture like TiO2-Al2O3. The differences in the spectra of NiTiO3, SrTiO3, BaTiO3 and PbTiO3 are discussed in terms of the different chemical environment and the local coordination. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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