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  • 11
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 17 (1973), S. 95-103 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Measurements were taken of the viscoelastic properties of six polymer melts by mean of the Weissenberg rheogoniometer and the Han slit/capillary rheometer. Polymers in vestigated were three high-density polyethylenes of different polydispersity, a low-density polyethylene, a polypropylene, and a polystyrene. The range of shear rates tested was from about 5.0 × 10-3 to 10 sec-1 with the Weissenberg rheogoniometer, from about 10 to 102 sec-1 with the slit rheometer, and from about 102 and 103 with the capillary rheometer: the temperature of measurement was 200°C. The three different apparatuses give consistent results over almost six decades of shear rates, yielding satisfactory correlations of shear viscosity to shear rate and of normal stress difference to shear rate.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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  • 12
    ISSN: 0935-9648
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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  • 13
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 851-857 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Because the chemical states of the elements in SrTiO3 thin film on Si are reduced by argon ion beam bombardment, it was impossible to sputter depth profile the chemical states of SrTiO3 thin film by argon ion beams. In this paper, it is reported that the undistorted chemical states of Ti and Si at the SrTiO3/Si interface can be determined with oxygen ion beams at the appropriate 70° angle of incidence, with which either metallic Ti is not oxidized or Ti in SrTiO3 is not reduced. Under the sputter depth profiling conditions, the chemical state of Ti at the SrTiO3/Si interface could be successfully characterized and the effects of post-annealing at high temperature on the chemical state of Ti were studied. A significant number of Ti atoms in the metallic state were observed at the SrTiO3/Si interface without any post-annealing but all of them were oxidized to the Ti4+ chemical state after 2 h post-annealing at the temperatures above 600°C under oxygen flow. The dielectric properties of SrTiO3 thin films on Si were well correlated to the oxidation state of Ti and the broadening of the interface SiO2 layer induced by post-annealing at high temperature.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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  • 14
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 1061-1066 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A GaAs/AlAs superlattice growth by metal-organic chemical vapour deposition is being proposed as the single crystalline multilayer reference material for sputter depth profiling. This material was characterized by transmission electron microscopy experiments, which showed that the interface between GaAs and AlAs is atomically flat. The preliminary depth profiling experiments were carried out by AES and SIMS.The AES experiments were performed using a Perkin-Elmer SAM 660 scanning Auger microprobe and the SIMS experiments were carried out using a VSW multitechnique XPS/SIMS surface analysis system.The AES and SIMS sputter depth profiling experiments proved that the depth resolution was found to be almost constant for each interface when an Ar+ beam was used for sputtering. Therefore the sputtering-induced roughness is very small for this material with Ar+ beam profiling, the depth resolution deteriorated as a function of depth, indicating oxygen ion beam-induced surface roughening.For both AES and SIMS, the depth resolution improved for ion beams with lower kinetic energy and more glancing angles of incidence.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
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  • 15
    Electronic Resource
    Electronic Resource
    New York : Wiley-Blackwell
    Journal of Polymer Science: Polymer Physics Edition 23 (1985), S. 2477-2482 
    ISSN: 0098-1273
    Keywords: Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Careful examination of x-ray diffraction patterns from melt-crystallized nylon 11 films show significant discrepancies with the proposed α-form structure. These discrepancies do not disappear after the samples have been annealed. The temperature dependence of the d spacings of the two strongest peaks show further evidence that the melt-crystallized and solution-cast films (α form) possess different crystal structures. These results suggest a different crystal structure for the melt-crystallized films; this would help explain the rather low piezoelectric response of these films and also the failure to observe a rapid decrease in polarization at the transition temperature.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 16
    Electronic Resource
    Electronic Resource
    Hoboken, NJ : Wiley-Blackwell
    Advances in Polymer Technology 12 (1993), S. 263-269 
    ISSN: 0730-6679
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Polypropylene (PP) powder was extruded in the presence of peroxide and multifunctional monomers at varying concentrations. With increasing peroxide concentration, MFI increased almost linearly, whereas hardness, modulus, and impact strength decreased, and the results were interpreted in terms of decreased molecular weight and its distribution by chain scission. On the other hand, triacrylate type multifunctional monomers (PETA and TMPTA) reduced the MFI of PP upon extrusion, and led to increase of Tm and Tc followed by increased modulus, yield strength, and elongation as well. TAIC and PBQ exerted effects smaller than triacrylate type. When the multifunctional monomers were added to the 0.01 phr peroxide containing system, MFI decreased below that of peroxide, and increased above that of multifunctional monomer of the same concentration, and synergistic physical properties were generally obtained, especially at low content of coagent. However, at higher peroxide concentration (0.05 and 0.1 phr) MFI increased with PETA and TMPTA, and decreased with PBQ. In general, increase and decrease of MFI were respectively followed by the decrease and increase of modules, strength, and impact strength as well. © 1993 John Wiley & Sons, Inc.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
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  • 17
    Electronic Resource
    Electronic Resource
    New York : Wiley-Blackwell
    Journal of Polymer Science Part A-1: Polymer Chemistry 9 (1971), S. 805-807 
    ISSN: 0449-296X
    Keywords: Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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